Archive: cfaed Seminar Series
Antonín Kučera
Faculty of Informatics, Masaryk University, Brno, Czech Republic
Andreas Kerber, PhD
GLOBALFOUNDRIES, Reliability Engineering (USA)
Reliability of scaled Metal Gate / High-K devices and its correlation to CMOS circuit aging
Dr. Michel Steuwer
University of Edinburgh, UK
Prof. Josef Michl
University of Colorado Boulder, USA
Direct Alkylation of Gold Surfaces with Solutions of Organometallics
Dr. Wladimir Thiessen
Institut für Angewandte Photophysik (IAPP), TU Dresden
Dr. Alexander Eisfeld
Max-Planck-Institute for the Physics of Complex Systems
Energy transfer and optical properties of light harvesting aggregates