Upcoming Events

3rd Dresden Nanoanalysis Symposium

17.04.2015 (Friday) , 09:00 - 15:30
Technische Universität Dresden, Dülfersaal , Dülferstraße 1 , 01069 Dresden

Registration

Please use the registration form (PDF) to register and send it back to linda.kriusk@tu-dresden.de or to +49 351 463 31985
by 27 March, 2015.

Registration fee
Students: 20€ (only with valid student card)
Non-students: 100 €

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Call for Papers - open now

Abstracts for a contributed paper with original scientific results which will be presented during the poster sessions.
The 3 best posters will be selected for the "Best Poster Award". A publication of selected papers in the journal "Advanced Engineering Materials" is also planned.

Submission deadline: 15 February, 2015
Please send a digital copy of your poster to linda.kriusk@tu-dresden.de by Sunday, 15 February 2015. Within the following weeks, you will get a feedback, if your poster has been accepted from the committee. If your poster has been accepted please bring it along to the Dülfersaal on Thursday, 16 April, 2015 between 1-3 pm or Friday 17 April, 2015 between 8-9 am.

A template for the poster is available here: PPT-file
Non-TUD investigators can of course use their own corporate design poster templates.

 

Program

(to download as a PDF-file click here)

  • 09:00 - 09:15 Welcome
    Ehrenfried Zschech, Fraunhofer IKTS Dresden and Technische Universität Dresden, Germany

  • 09:15 - 09:40 Material modeling, numerical simulation and characterization - Basis for modern materials science and engineering
    Krzysztof Kurzydlowski, NCBiR Warsaw, Poland

  • 09:40 - 10:05 Combining X-ray microtomography with the finite elements method to study damage and cracking in structural materials
    Henry Proudhon, Centre des Matériaux MINES Paristech, France

  • 10:05 - 10:30
    Characterization of Nanowires – Electrical, Optical, Thermal
    Heike Riel, IBM Research, Rüschlikon, Switzerland

  • 10:30 - 10:55
    3D chemical analysis of nanodevices using correlative transmission electron microscopy and atom probe tomography
    Adeline Grenier, CEA, LETI, MINATEC Campus, Grenoble, France


  • 10:55 - 11:25
    Coffee break and poster session


  • 11:25 - 11:50
    Materials for a new window of the ICT age
    Rodrigo Martins, University Lisbon, Portugal

  • 11:50 - 12:15
    Organic electronics - A challenge for nanoanalysis
    Karl Leo, Technische Universität Dresden, Germany

  • 12:15 - 12:40
    Characterization of nano-structured polymer systems: From nano-medicine to function electronic materials and smart polymers
    Ulrich S. Schubert, University Jena, Germany


  • 12:40 - 13:40
    Lunch break and poster session


  • 13:40 - 14:05
    Advancements in Electron Microscopy for the Electronics Market
    Rob Krueger, FEI, Eindhoven, Netherlands

  • 14:05 - 14:30 Recent Applications of an Environmental, Aberration-corrected TEM for Nanomaterial Studies
    Robert Sinclair, Stanford University, Palo Alto/CA, USA

  • 14:30 - 14:55
    Nano X-ray tomography – Novel concepts and applications for energy storage
    Jürgen Gluch, Fraunhofer Institute for Ceramic Technologies and Systems Dresden, Germany

  • 14:55 - 15:20
    Fracture toughness and crack propagation analysis for metal-dielectric stacks
    Michael Hecker, GLOBALFOUNDRIES, Dresden, Germany

  • 15:20 - 15:30
    Closing remarks and poster prizes
    Ehrenfried Zschech, Fraunhofer IKTS Dresden and Technische Universität Dresden, Germany

 



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