Upcoming Events
3rd Dresden Nanoanalysis Symposium
        
        17.04.2015 (Friday)        
        , 09:00 - 15:30
        
                Technische Universität Dresden, Dülfersaal                ,                 Dülferstraße 1                ,                 01069                                         Dresden            
Registration
Please use the registration form (PDF) to register and send it back to linda.kriusk@tu-dresden.de or to +49 351 463 31985
by 27 March, 2015.
Registration fee
Students: 20€ (only with valid student card)
Non-students: 100 €
Call for Papers - open now
Abstracts for a contributed paper with original scientific results which will be presented during the poster sessions.
The 3 best posters will be selected for the "Best Poster Award". A publication of selected papers in the journal "Advanced Engineering Materials" is also planned. 
Submission deadline: 15 February, 2015
Please send a digital copy of your poster to linda.kriusk@tu-dresden.de by Sunday, 15 February 2015. Within the following weeks, you will get a feedback, if your poster has been accepted from the committee. If your poster has been accepted please bring it along to the Dülfersaal on Thursday, 16 April, 2015 between 1-3 pm or Friday 17 April, 2015 between 8-9 am.
A template for the poster is available here: PPT-file
Non-TUD investigators can of course use their own corporate design poster templates.
Program
(to download as a PDF-file click here)
- 09:00 - 09:15 Welcome
 Ehrenfried Zschech, Fraunhofer IKTS Dresden and Technische Universität Dresden, Germany
- 09:15 - 09:40 Material modeling, numerical simulation and characterization - Basis for modern materials science and engineering
 Krzysztof Kurzydlowski, NCBiR Warsaw, Poland
- 09:40 - 10:05 Combining X-ray microtomography with the finite elements method to study damage and cracking in structural materials
 Henry Proudhon, Centre des Matériaux MINES Paristech, France
- 10:05 - 10:30
 Characterization of Nanowires – Electrical, Optical, Thermal
 Heike Riel, IBM Research, Rüschlikon, Switzerland
- 10:30 - 10:55
 3D chemical analysis of nanodevices using correlative transmission electron microscopy and atom probe tomography
 Adeline Grenier, CEA, LETI, MINATEC Campus, Grenoble, France
- 10:55 - 11:25
 Coffee break and poster session
- 11:25 - 11:50
 Materials for a new window of the ICT age
 Rodrigo Martins, University Lisbon, Portugal
- 11:50 - 12:15
 Organic electronics - A challenge for nanoanalysis
 Karl Leo, Technische Universität Dresden, Germany
- 12:15 - 12:40
 Characterization of nano-structured polymer systems: From nano-medicine to function electronic materials and smart polymers
 Ulrich S. Schubert, University Jena, Germany
- 12:40 - 13:40
 Lunch break and poster session
- 13:40 - 14:05
 Advancements in Electron Microscopy for the Electronics Market
 Rob Krueger, FEI, Eindhoven, Netherlands
- 14:05 - 14:30 Recent Applications of an Environmental, Aberration-corrected TEM for Nanomaterial Studies
 Robert Sinclair, Stanford University, Palo Alto/CA, USA
- 14:30 - 14:55
 Nano X-ray tomography – Novel concepts and applications for energy storage
 Jürgen Gluch, Fraunhofer Institute for Ceramic Technologies and Systems Dresden, Germany
- 14:55 - 15:20
 Fracture toughness and crack propagation analysis for metal-dielectric stacks
 Michael Hecker, GLOBALFOUNDRIES, Dresden, Germany
- 15:20 - 15:30
 Closing remarks and poster prizes
 Ehrenfried Zschech, Fraunhofer IKTS Dresden and Technische Universität Dresden, Germany

 
		

