Prof. Ingmar Kalfass, Dr. Martin Claus , Universität Stuttgart, TU Dresden
Semiconductor Devices Characterization Seminar Dresden
, 09:00 - 17:00
Max Planck Institute for the Physics of Complex Systems , Nöthnitzer Straße 38 , 01187 Dresden
Technical Seminar addressing the challenges of CMOS, Power and RF semiconductor device measurement & modeling
As the semiconductor industry continues to advance technologies with nanometer feature sizes, newer material systems, existing challenges are exacerbated and new ones arise. In these seminars, the complete characterization & modeling flow will be demoed: from on-wafer measurements to Spice model libraries characterization through DC, Power and RF devices extraction.
Our guest speaker will be Prof. Ingmar Kalfass of the Institute of Robust Power Semiconductor Systems, University of Stuttgart. He will talk about Power Module Design. Cfaed Research Group Leader Dr. Martin Claus will also give a lecture on the topic "Electrothermal modeling and characterization of advanced transistor technologies". Moreover, other well-known companies will contribute to this training program through interesting presentations and solution approaches.
Come and interact with Keysight and partner experts to learn more about the full flow of device modeling and characterization.