Publications

  • 2017

  • Jens Trommer, André Heinzig, Uwe Mühle, Markus Löffler, Annett Winzer, Paul M. Jordan, Jürgen Beister, Tim Baldauf, Marion Geidel, Barbara Adolphi, Ehrenfried Zschech, Thomas Mikolajick, Walter M. Weber, "Enabling Energy Efficiency and Polarity Control in Germanium Nanowire Transistors by Individually Gated Nanojunctions" , In ACS Nano, American Chemical Society (ACS), Jan 2017. [doi] [Bibtex & Downloads]
  • Chongqing Yang, Karl Sebastian Schellhammer, Frank Ortmann, Sai Sun, Renhao Dong, Melike Karakus, Zoltán Mics, Markus Löffler, Fan Zhang, Xiaodong Zhuang, Enrique Cánovas, Gianaurelio Cuniberti, Mischa Bonn, Xinliang Feng, "Coordination Polymer Framework-Based On-Chip Micro-Supercapacitors with AC Line-Filtering Performance" , In Angewandte Chemie International Edition, Wiley-Blackwell, 2017. [doi] [Bibtex & Downloads]
  • 2016

  • Aranzazu Garitagoitia Cid, Elham Moayedi, Rudiger Rosenkranz, Andre Clausner, Khashayar Pakbaz, Ehrenfried Zschech, "Non-Destructive Imaging of Organosilicate Glass (OSG) Thin Films at Low Voltage With the EsB Detector" , In IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers (IEEE), vol. 16, no. 4, pp. 461–464, Dec 2016. [doi] [Bibtex & Downloads]
  • P. Czaja, J. Przewoźnik, Ł. Gondek, L. Hawelek, A. Żywczak, E. Zschech, "Low temperature stability of 4O martensite in Ni49.1Mn38.9Sn12 metamagnetic Heusler alloy ribbons" , In Journal of Magnetism and Magnetic Materials, Elsevier BV, Jul 2016. [doi] [Bibtex & Downloads]
  • Aránzazu Garitagoitia Cid, Rüdiger Rosenkranz, Ehrenfried Zschech, "Optimization of the SEM Working Conditions: EsB Detector at Low Voltage" , In Advanced Engineering Materials, vol. 18, no. 2, pp. 185–193, 2016. [doi] [Bibtex & Downloads]
  • Aránzazu Garitagoitia Cid, Mona Sedighi, Markus Löffler, Willem van Dorp, Ehrenfried Zschech, "Energy-Filtered Backscattered Imaging using Low Voltage Scanning Electron Microscopy: Characterizing Blends of ZnPc-C60 for Organic Solar Cells" (to appear), 2016. [doi] [Bibtex & Downloads]
  • Manuel Oliva-Ramirez, Angel Barranco, Markus Löffler, Francisco Yubero, Agustin R. González-Elipe, "Optofluidic Modulation of Self-Associated Nanostructural Units Forming Planar Bragg Microcavities" , In ACS Nano, vol. 10, no. 1, pp. 1256-1264, 2016. [doi] [Bibtex & Downloads]
  • J. Huang, M. Loeffler, W. Moeller, E. Zschech, "Ga contamination in silicon by Focused Ion Beam milling: Dynamic model simulation and Atom Probe Tomography experiment" , In Microelectronics Reliability, vol. 64, no. , pp. 390-392, 2016. [doi] [Bibtex & Downloads]
  • C Lopez-Santos, R Alvarez, A Garcia-Valenzuela, V Rico, M Loeffler, A R Gonzalez-Elipe, A Palmero, "Nanocolumnar association and domain formation in porous thin films grown by evaporation at oblique angles" , In Nanotechnology, vol. 27, no. 39, pp. 395702, 2016. [Bibtex & Downloads]
  • 2015

  • Sayanti Banerjee, Markus Löffler, Uwe Muehle, Katarzyna Berent, Walter Weber, Ehrenfried Zschech, "TEM Study of Schottky Junctions in Reconfigurable Silicon Nanowire Devices" , In Advanced Engineering Materials, Wiley Online Library, 2015. [Bibtex & Downloads]
  • Zhongquan Liao, Martin Gall, Kong Boon Yeap, Christoph Sander, Uwe Mühle, Jürgen Gluch, Yvonne Standke, Oliver Aubel, Norman Vogel, Meike Hauschildt, others, "In-situ study of the TDDB-induced damage mechanism in Cu/ultra-low-k interconnect structures" , In Microelectronic Engineering, Elsevier, vol. 137, pp. 47–53, 2015. [Bibtex & Downloads]
  • Zhongquan Liao, Martin Gall, Kong Boon Yeap, Christoph Sander, André Clausner, Uwe Mühle, Jürgen Gluch, Yvonne Standke, Oliver Aubel, Armand Beyer, others, "In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices" , In JoVE (Journal of Visualized Experiments), no. 100, pp. e52447–e52447, 2015. [Bibtex & Downloads]
  • Sayanti Banerjee, Uwe Muehle, Markus Löffler, Andre Heinzig, Jens Trommer, Ehrenfried Zschech, "Preparation and characterization of silicon nanowires using SEM/FIB and TEM: Paper presented at “XV International Conference on Electron Microscopy”, 15–18 September 2014, Cracow, Poland" , In International Journal of Materials Research, Carl Hanser Verlag, vol. 106, no. 7, pp. 697–702, 2015. [Bibtex & Downloads]
  • 2014

  • Markus Löffler, Sayanti Banerjee, Jens Trommer, Andre Heinzig, Walter Weber, Ehrenfried Zschech, "In-Situ Investigations of Individual Nanowires within a FIB/SEM System" , In Microscopy and Microanalysis, Cambridge Univ Press, vol. 20, no. S3, pp. 360–361, 2014. [Bibtex & Downloads]
  • Sven Niese, Peter Krüger, Adam Kubec, Stefan Braun, Jens Patommel, Christian G Schroer, Andreas Leson, Ehrenfried Zschech, "Full-field X-ray microscopy with crossed partial multilayer Laue lenses" , In Optics express, Optical Society of America, vol. 22, no. 17, pp. 20008–20013, 2014. [doi] [Bibtex & Downloads]
  • Zhongquan Liao, Martin Gall, Kong Boon Yeap, Christoph Sander, Oliver Aubel, Uwe Mühle, Jürgen Gluch, Sven Niese, Yvonne Standke, Rüdiger Rosenkranz, others, "A New In Situ Microscopy Approach to Study the Degradation and Failure Mechanisms of Time-Dependent Dielectric Breakdown: Set-Up and Opportunities" , In Advanced Engineering Materials, Wiley Online Library, vol. 16, no. 5, pp. 486–493, 2014. [Bibtex & Downloads]
  • Ehrenfried Zschech, Sven Niese, Markus Löffler, M Jürgen Wolf, "Multi-scale X-ray tomography for process and quality control in 3D TSV packaging" , In Proceeding: International Symposium on Microelectronics, vol. 2014, no. 1, pp. 000184–000187, 2014. [Bibtex & Downloads]

Contributions

Toward Self-Assembled Plasmonic Devices: High-Yield Arrangement of Gold Nanoparticles on DNA Origami Templates (2016)

Fatih N. Gur, Friedrich W. Schwarz, Jingjing Ye, Stefan Diez, and Thorsten L. Schmidt

  • Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, 01062 Dresden, Germany
  • B CUBE - Center for Molecular Bioengineering, Technische Universitat Dresden, 01307 Dresden, Germany
  • Max Planck Institute of Molecular Cell Biology and Genetics, 01307 Dresden, Germany

PDF: http://pubs.acs.org/doi/pdf/10.1021/acsnano.6b01537