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Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy
Reference
Andreas Neff, Falk Niefind, Bernd Abel, Stefan C. B. Mannsfeld, Katrin R. Siefermann, "Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy", In Advanced Materials, Wiley, vol. 29, no. 29, pp. 1701012, May 2017. [doi]
Bibtex
@article{Neff_2017,
doi = {10.1002/adma.201701012},
url = {https://doi.org/10.1002%2Fadma.201701012},
year = 2017,
month = {may},
publisher = {Wiley},
volume = {29},
number = {29},
pages = {1701012},
author = {Andreas Neff and Falk Niefind and Bernd Abel and Stefan C. B. Mannsfeld and Katrin R. Siefermann},
title = {Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy},
journal = {Advanced Materials}
}
doi = {10.1002/adma.201701012},
url = {https://doi.org/10.1002%2Fadma.201701012},
year = 2017,
month = {may},
publisher = {Wiley},
volume = {29},
number = {29},
pages = {1701012},
author = {Andreas Neff and Falk Niefind and Bernd Abel and Stefan C. B. Mannsfeld and Katrin R. Siefermann},
title = {Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy},
journal = {Advanced Materials}
}
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