Prices and Core Toolset

 

Prices

The DCN is listed in the RIsources portal (RI = Research Infrastructure) operated by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) because it

  • offers recognised, established scientific and technological facilities and services
  • permit free access / regulate access through a transparent selection process based on scientific quality and project feasibility
  • is managed according to sustainable principles and has a long-term perspective

So the DFG equipment center "DCN" allows external partners even better access to excellent technological infrastructure and the special features of the Dresden Center for Nanoanalysis (DCN). Companies and scientific institutions are managed from a single source.

To reserve laboratories and equipment, they receive information on technical equipment and expertise of the technological center and eventually a binding cost estimate, which consideres  funding and subsidy possibilities.

For more information please get in contact with us.

 

 

Core Toolset

(status: December 2017)

If you want to use one of the listed tools please get in contact with us.
Please see as well the Nutzungsordnung (Terms & Conditions) of the DCN. You can download it here.

# Tool Manufacturer Specific name / Type Location
A scanning electron microscope (SEM) / focused ion beam (FIB) FEI Helios NanoLab 660 DCN/TU Dresden
B high-resolution scanning electron microscope (SEM) Zeiss Gemini SEM500 DCN/TU Dresden
C X-ray microscope (XRM) Zeiss Versa 520 DCN/TU Dresden
D Indenter Hysitron PI 87 DCN/TU Dresden
01 high-resolution scanning electron microscope (SEM) HITACHI S4700 Inst. f. Halbleiter u. Mikrosystemtechnik/TU Dresden
02 high-resolution scanning electron microscope (SEM)  HITACHI SU8020 Anorganische Chemie/TU Dresden
03 atomic force acoustic microscope (AFAM) Digital Instrument Dimension 3000 Fraunhofer IKTS-MD
04 atomic force acoustic microscope (AFAM) Agilent 5600 LS Fraunhofer IKTS-MD
05 Nanoindenter Hysitron TI 950 Fraunhofer IKTS-MD
06 scanning electron microscope (SEM) / focused ion beam (FIB) Zeiss NVision 40 Fraunhofer IKTS-MD
07 transmission electron microscope (TEM) Zeiss Libra 200 HR MC Cs STEM Fraunhofer IKTS-MD
08 X-ray microscope (XRM) Xradia NanoXCT-100 Fraunhofer IKTS-MD
26 Infrared Spectrometer (ATR-FTIR) Thermo Nicolet 6700 ITM/TU Dresden