Prices and Core Toolset

 

Prices

The DCN is listed in the RIsources portal (RI = Research Infrastructure) operated by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) because it

  • offers recognised, established scientific and technological facilities and services
  • permit free access / regulate access through a transparent selection process based on scientific quality and project feasibility
  • is managed according to sustainable principles and has a long-term perspective

So the DFG equipment center "DCN" allows external partners even better access to excellent technological infrastructure and the special features of the Dresden Center for Nanoanalysis (DCN). Companies and scientific institutions are managed from a single source.

To reserve laboratories and equipment, they receive information on technical equipment and expertise of the technological center and eventually a binding cost estimate, which consideres  funding and subsidy possibilities.

For more information please get in contact with us.

 

 

Core Toolset

(status: June 2016)

If you want to use one of the listed tools please get in contact with us.
Please see as well the Nutzungsordnung (Terms & Conditions) of the DCN. You can download it here.

# Tool Manufacturer Specific name / Type Toolowner
A scanning electron microscope (SEM) / focused ion beam (FIB) FEI Helios NanoLab 660 Prof. Ehrenfried Zschech / TUD Dresden
B high-resolution scanning electron microscope (SEM) Zeiss Gemini SEM500 Prof. Ehrenfried Zschech / TUD Dresden
C X-ray microscope (XRM) Zeiss Versa 520 Prof. Ehrenfried Zschech / TUD Dresden
D Indenter Hysitron PI 87 Prof. Ehrenfried Zschech / TUD Dresden
01 high-resolution scanning electron microscope (SEM) HITACHI S4700 Dr. Enrico Langer/ TU Dresden
02 high-resolution scanning electron microscope (SEM)  HITACHI SU8020 Prof. Dr. Thomas Doert / TU Dresden
03 atomic force acoustic microscope (AFAM) Digital Instrument Dimension 3000 Dr. Malgorzata Kopycinska-Müller / Fraunhofer IKTS
04 atomic force acoustic microscope (AFAM) Agilent 5600 LS Dr. Malgorzata Kopycinska-Müller / Fraunhofer IKTS
05 Nanoindenter Hysitron TI 950 Dr. André Clausner / Fraunhofer IKTS
06 scanning electron microscope (SEM) / focused ion beam (FIB) Zeiss NVision 40 Dr. Rüdiger Rosenkranz / Fraunhofer IKTS
07 transmission electron microscope (TEM) Zeiss Libra 200 HR MC Cs STEM Dr. Uwe Mühle / Fraunhofer IKTS
08 X-ray microscope (XRM) Xradia NanoXCT-100 Dr. Uwe Mühle / Fraunhofer IKTS
10 environmental scanning electron microscope (ESEM) FEI QUANTA FEG 250  Dr. Christof Schröfl / TU Dresden
14 low-temperature atomic force microscope (AFM) Omicron LT-SPM Prof. Dr. Lukas Eng / IAPP Dresden
15 room-temperature atomic force microscope (AFM) Cypher RT-SPM Prof. Dr. Lukas Eng / IAPP Dresden
16 room-temperature atomic force microscope (AFM) AIST-NT SMART-SPM Prof. Dr. Lukas Eng / IAPP Dresden
17 single-crystal X-ray diffractometer (SC-XRD) STOE IPDS-II Prof. Dr. Thomas Doert / TU Dresden
18 single-crystal X-ray diffractometer (SC-XRD) Bruker-AXS APEX II Prof. Dr. Thomas Doert / TU Dresden
19 X-ray powder diffraction (XRPD) PANalytical  XPert Pro Prof. Dr. Thomas Doert / TU Dresden
25 Scanning Electron Microscopy (SEM) Zeiss FEG-SEM Ultra 55 Dr. Ellen Hieckmann / TU Dresden
26 Infrared Spectrometer (ATR-FTIR) Thermo Nicolet 6700 Dr. Rolf-Dieter Hund / ITM - TU Dresden