Prices and Core Toolset
The DCN is listed in the RIsources portal (RI = Research Infrastructure) operated by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) because it
- offers recognised, established scientific and technological facilities and services
- permit free access / regulate access through a transparent selection process based on scientific quality and project feasibility
- is managed according to sustainable principles and has a long-term perspective
So the DFG equipment center "DCN" allows external partners even better access to excellent technological infrastructure and the special features of the Dresden Center for Nanoanalysis (DCN). Companies and scientific institutions are managed from a single source.
To reserve laboratories and equipment, they receive information on technical equipment and expertise of the technological center and eventually a binding cost estimate, which consideres funding and subsidy possibilities.
For more information please get in contact with us.
(status: December 2017)
If you want to use one of the listed tools please get in contact with us.
Please see as well the Nutzungsordnung (Terms & Conditions) of the DCN. You can download it here.
|#||Tool||Manufacturer||Specific name / Type||Location|
|A||scanning electron microscope (SEM) / focused ion beam (FIB)||FEI||Helios NanoLab 660||DCN/TU Dresden|
|B||high-resolution scanning electron microscope (SEM)||Zeiss||Gemini SEM500||DCN/TU Dresden|
|C||X-ray microscope (XRM)||Zeiss||Versa 520||DCN/TU Dresden|
|D||Indenter||Hysitron||PI 87||DCN/TU Dresden|
|01||high-resolution scanning electron microscope (SEM)||HITACHI||S4700||Anorganische Chemie/TU Dresden|
|02||high-resolution scanning electron microscope (SEM)||HITACHI||SU8020||Anorganische Chemie/TU Dresden|
|03||atomic force acoustic microscope (AFAM)||Digital Instrument||Dimension 3000||Fraunhofer IKTS-MD|
|04||atomic force acoustic microscope (AFAM)||Agilent||5600 LS||Fraunhofer IKTS-MD|
|05||Nanoindenter||Hysitron||TI 950||Fraunhofer IKTS-MD|
|06||scanning electron microscope (SEM) / focused ion beam (FIB)||Zeiss||NVision 40||Fraunhofer IKTS-MD|
|07||transmission electron microscope (TEM)||Zeiss||Libra 200 HR MC Cs STEM||Fraunhofer IKTS-MD|
|08||X-ray microscope (XRM)||Xradia||NanoXCT-100||Fraunhofer IKTS-MD|
|26||Infrared Spectrometer (ATR-FTIR)||Thermo Nicolet||6700||ITM/TU Dresden|