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Quantifying the Damage Induced by X-ray Photoelectron Spectroscopy Depth Profiling of Organic Conjugated Polymers
Reference
Yvonne J. Hofstetter, Yana Vaynzof, "Quantifying the Damage Induced by X-ray Photoelectron Spectroscopy Depth Profiling of Organic Conjugated Polymers", In ACS Applied Polymer Materials, American Chemical Society (ACS), vol. 1, no. 6, pp. 1372–1381, Apr 2019. [doi]
Bibtex
@article{Hofstetter_2019,
doi = {10.1021/acsapm.9b00148},
url = {https://doi.org/10.1021%2Facsapm.9b00148},
year = 2019,
month = {apr},
publisher = {American Chemical Society ({ACS})},
volume = {1},
number = {6},
pages = {1372--1381},
author = {Yvonne J. Hofstetter and Yana Vaynzof},
title = {Quantifying the Damage Induced by X-ray Photoelectron Spectroscopy Depth Profiling of Organic Conjugated Polymers},
journal = {{ACS} Applied Polymer Materials}
}
doi = {10.1021/acsapm.9b00148},
url = {https://doi.org/10.1021%2Facsapm.9b00148},
year = 2019,
month = {apr},
publisher = {American Chemical Society ({ACS})},
volume = {1},
number = {6},
pages = {1372--1381},
author = {Yvonne J. Hofstetter and Yana Vaynzof},
title = {Quantifying the Damage Induced by X-ray Photoelectron Spectroscopy Depth Profiling of Organic Conjugated Polymers},
journal = {{ACS} Applied Polymer Materials}
}
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