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Using a quartz paraboloid for versatile wide-field TIR microscopy with sub-nanometer localization accuracy
Reference
René Schneider, Tilman Glaser, Michael Berndt, Stefan Diez, "Using a quartz paraboloid for versatile wide-field TIR microscopy with sub-nanometer localization accuracy", In Optics express, Optical Society of America, vol. 21, no. 3, pp. 3523–3539, 2013. [doi]
Bibtex
@article{schneider2013using,
title={Using a quartz paraboloid for versatile wide-field TIR microscopy with sub-nanometer localization accuracy},
author={Schneider, Ren{\'e} and Glaser, Tilman and Berndt, Michael and Diez, Stefan},
journal={Optics express},
volume={21},
number={3},
pages={3523--3539},
year={2013},
publisher={Optical Society of America},
doi={10.1364/OE.21.003523}
}
title={Using a quartz paraboloid for versatile wide-field TIR microscopy with sub-nanometer localization accuracy},
author={Schneider, Ren{\'e} and Glaser, Tilman and Berndt, Michael and Diez, Stefan},
journal={Optics express},
volume={21},
number={3},
pages={3523--3539},
year={2013},
publisher={Optical Society of America},
doi={10.1364/OE.21.003523}
}
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