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Methods for determining the emitter resistance in SiGe HBTs: A review and evaluation across different technologies
Reference
Julia Krause, Michael Schröter, "Methods for determining the emitter resistance in SiGe HBTs: A review and evaluation across different technologies" , In IEEE Transactions on Electron Devices, vol. 62, no. 5, pp. 1363-1374, May 2015.
Bibtex
@Article{ auto-key*br,
author = {Julia Krause and Michael Schröter},
title = {Methods for determining the emitter resistance in {SiGe HBTs: A} review and evaluation across different technologies},
journal = {IEEE Transactions on Electron Devices},
volume = {62},
number = {5},
pages = {1363-1374},
month = may,
year = {2015},
project = {A06}
}
author = {Julia Krause and Michael Schröter},
title = {Methods for determining the emitter resistance in {SiGe HBTs: A} review and evaluation across different technologies},
journal = {IEEE Transactions on Electron Devices},
volume = {62},
number = {5},
pages = {1363-1374},
month = may,
year = {2015},
project = {A06}
}
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