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Formation and Characterization of Multilayer GeSi Nanowires on Miscut Si (001) Substrates
Reference
Hua Gong, Peixuan Chen, Yingjie Ma, Lijun Wang, Armando Rastelli, Oliver G Schmidt, Zhenyang Zhong, "Formation and Characterization of Multilayer GeSi Nanowires on Miscut Si (001) Substrates", In Journal of nanoscience and nanotechnology, American Scientific Publishers, vol. 13, no. 2, pp. 834–838, 2013. [doi]
Bibtex
@article{gong2013formation,
title={Formation and Characterization of Multilayer GeSi Nanowires on Miscut Si (001) Substrates},
author={Gong, Hua and Chen, Peixuan and Ma, Yingjie and Wang, Lijun and Rastelli, Armando and Schmidt, Oliver G and Zhong, Zhenyang},
journal={Journal of nanoscience and nanotechnology},
volume={13},
number={2},
pages={834--838},
year={2013},
publisher={American Scientific Publishers},
doi={10.1166/jnn.2013.5979}
}
title={Formation and Characterization of Multilayer GeSi Nanowires on Miscut Si (001) Substrates},
author={Gong, Hua and Chen, Peixuan and Ma, Yingjie and Wang, Lijun and Rastelli, Armando and Schmidt, Oliver G and Zhong, Zhenyang},
journal={Journal of nanoscience and nanotechnology},
volume={13},
number={2},
pages={834--838},
year={2013},
publisher={American Scientific Publishers},
doi={10.1166/jnn.2013.5979}
}
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