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Preparation and characterization of silicon nanowires using SEM/FIB and TEM

Reference

Sayanti Banerjee, Uwe Muehle, Markus Löffler, Andre Heinzig, Jens Trommer, Ehrenfried Zschech, "Preparation and characterization of silicon nanowires using SEM/FIB and TEM" , In International Journal of Materials Research, Carl Hanser Verlag, vol. 106, no. 7, pp. 697–702, Jul 2015. [doi]

Bibtex

@article{Banerjee_2015,
doi = {10.3139/146.111249},
url = {https://doi.org/10.3139%2F146.111249},
year = 2015,
month = {jul},
publisher = {Carl Hanser Verlag},
volume = {106},
number = {7},
pages = {697--702},
author = {Sayanti Banerjee and Uwe Muehle and Markus Löffler and Andre Heinzig and Jens Trommer and Ehrenfried Zschech},
title = {Preparation and characterization of silicon nanowires using {SEM}/{FIB} and {TEM}},
journal = {International Journal of Materials Research}
}

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Silicon Nanowire Path

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