cfaed Publications

In-Situ Investigations of Individual Nanowires within a FIB/SEM System

Reference

Markus Löffler, Sayanti Banerjee, Jens Trommer, Andre Heinzig, Walter Weber, Ehrenfried Zschech, "In-Situ Investigations of Individual Nanowires within a FIB/SEM System" , In Microscopy and Microanalysis, Cambridge Univ Press, vol. 20, no. S3, pp. 360–361, 2014.

Bibtex

@article{loeffler2014situ,
title={In-Situ Investigations of Individual Nanowires within a FIB/SEM System},
author={L{\"o}ffler, Markus and Banerjee, Sayanti and Trommer, Jens and Heinzig, Andre and Weber, Walter and Zschech, Ehrenfried},
journal={Microscopy and Microanalysis},
volume={20},
number={S3},
pages={360--361},
year={2014},
publisher={Cambridge Univ Press}
}

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Related Paths

Silicon Nanowire Path, DCN

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https://cfaed.tu-dresden.de/publications?pubId=260


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