cfaed Publications

CL(R)Early: An Early-stage DSE Methodology for Cross-Layer Reliability-aware Heterogeneous Embedded Systems

Reference

Siva Satyendra Sahoo, Bharadwaj Veeravalli, Akash Kumar, "CL(R)Early: An Early-stage DSE Methodology for Cross-Layer Reliability-aware Heterogeneous Embedded Systems", Proceedings of the 57th Annual Design Automation Conference 2020, Association for Computing Machinery, New York, NY, USA, July 2020.

Bibtex

@INPROCEEDINGS{9218747,
author={S. S. {Sahoo} and B. {Veeravalli} and A. {Kumar}},
booktitle={2020 57th ACM/IEEE Design Automation Conference (DAC)},
title={CL(R)Early: An Early-stage DSE Methodology for Cross-Layer Reliability-aware Heterogeneous Embedded Systems},
year={2020},
volume={},
number={},
pages={1-6},
doi={10.1109/DAC18072.2020.9218747}}

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CLRIntegTMap_DAC2020_CameraReady(1) [PDF]

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https://cfaed.tu-dresden.de/publications?pubId=2816


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