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Impact of Dynamic Trapping on High Frequency Organic Field-Effect Transistors
Reference
Markus Mueller, Shabnam Donnhauser, Sven Mothes, Anibal Pacheco-Sanchez, Katherina Haase, Stefan C. B. Mannsfeld, Martin Claus, "Impact of Dynamic Trapping on High Frequency Organic Field-Effect Transistors", In Proceeding: 2020 27th International Conference on Mixed Design of Integrated Circuits and System (MIXDES), IEEE, Jun 2020. [doi]
Bibtex
@inproceedings{Mueller_2020,
doi = {10.23919/mixdes49814.2020.9155644},
url = {https://doi.org/10.23919%2Fmixdes49814.2020.9155644},
year = 2020,
month = {jun},
publisher = ,
author = {Markus Mueller and Shabnam Donnhauser and Sven Mothes and Anibal Pacheco-Sanchez and Katherina Haase and Stefan C. B. Mannsfeld and Martin Claus},
title = {Impact of Dynamic Trapping on High Frequency Organic Field-Effect Transistors},
booktitle = {2020 27th International Conference on Mixed Design of Integrated Circuits and System ({MIXDES})}
}
doi = {10.23919/mixdes49814.2020.9155644},
url = {https://doi.org/10.23919%2Fmixdes49814.2020.9155644},
year = 2020,
month = {jun},
publisher = ,
author = {Markus Mueller and Shabnam Donnhauser and Sven Mothes and Anibal Pacheco-Sanchez and Katherina Haase and Stefan C. B. Mannsfeld and Martin Claus},
title = {Impact of Dynamic Trapping on High Frequency Organic Field-Effect Transistors},
booktitle = {2020 27th International Conference on Mixed Design of Integrated Circuits and System ({MIXDES})}
}
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