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Multiscale-modeling of CNTFETs with non-regular defect pattern
Reference
M. Claus, D. Teich, S. Mothes, G. Seifert, M. Schroter, "Multiscale-modeling of CNTFETs with non-regular defect pattern", In Proceeding: Computational Electronics (IWCE), 2015 International Workshop on, pp. 1–2, 2015.
Bibtex
@inproceedings{claus2015multiscale,
title={Multiscale-modeling of CNTFETs with non-regular defect pattern},
author={Claus, M and Teich, D and Mothes, S and Seifert, G and Schroter, M},
booktitle={Computational Electronics (IWCE), 2015 International Workshop on},
pages={1--2},
year={2015},
organization={IEEE}
}
title={Multiscale-modeling of CNTFETs with non-regular defect pattern},
author={Claus, M and Teich, D and Mothes, S and Seifert, G and Schroter, M},
booktitle={Computational Electronics (IWCE), 2015 International Workshop on},
pages={1--2},
year={2015},
organization={IEEE}
}
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