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Conductive AFM for CNT characterization
Reference
Marius Toader, Holger Fiedler, Sascha Hermann, Stefan E Schulz, Thomas Gessner, Michael Hietschold, "Conductive AFM for CNT characterization", In Nanoscale Research Letters, Springer Nature, vol. 8, no. 1, pp. 24, 2013. [doi]
Bibtex
@article{Toader_2013,
title={Conductive AFM for CNT characterization},
volume={8},
ISSN={1556-276X},
url={http://dx.doi.org/10.1186/1556-276X-8-24},
DOI={10.1186/1556-276x-8-24},
number={1},
journal={Nanoscale Research Letters},
publisher={Springer Nature},
author={Toader, Marius and Fiedler, Holger and Hermann, Sascha and Schulz, Stefan E and Gessner, Thomas and Hietschold, Michael},
year={2013},
pages={24}
}
title={Conductive AFM for CNT characterization},
volume={8},
ISSN={1556-276X},
url={http://dx.doi.org/10.1186/1556-276X-8-24},
DOI={10.1186/1556-276x-8-24},
number={1},
journal={Nanoscale Research Letters},
publisher={Springer Nature},
author={Toader, Marius and Fiedler, Holger and Hermann, Sascha and Schulz, Stefan E and Gessner, Thomas and Hietschold, Michael},
year={2013},
pages={24}
}
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