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A novel method for measuring the dielectric properties of solid materials in the microwave range
Reference
Patrick Seiler, Bernhard Klein, Niels Neumann, Dirk Plettemeier, "A novel method for measuring the dielectric properties of solid materials in the microwave range", In Proceeding: Microwave Symposium (MMS), 2015 IEEE 15th Mediterranean, pp. 1–4, 2015.
Bibtex
@inproceedings{seiler2015novel,
title={A novel method for measuring the dielectric properties of solid materials in the microwave range},
author={Seiler, Patrick and Klein, Bernhard and Neumann, Niels and Plettemeier, Dirk},
booktitle={Microwave Symposium (MMS), 2015 IEEE 15th Mediterranean},
pages={1--4},
year={2015},
organization={IEEE}
}
title={A novel method for measuring the dielectric properties of solid materials in the microwave range},
author={Seiler, Patrick and Klein, Bernhard and Neumann, Niels and Plettemeier, Dirk},
booktitle={Microwave Symposium (MMS), 2015 IEEE 15th Mediterranean},
pages={1--4},
year={2015},
organization={IEEE}
}
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HAEC, HAEC, Biomolecular-Assembled Circuits Path
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