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Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy

Reference

Imad Ibrahim, Mark H Rümmeli, Nitesh Ranjan, Bernd Büchner, Gianaurelio Cuniberti, "Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy" , In Nanotechnology, IOP Publishing, vol. 24, no. 23, pp. 235708, 2013.

Bibtex

@article{ibrahim2013spatial,
title={Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy},
author={Ibrahim, Imad and R{\"u}mmeli, Mark H and Ranjan, Nitesh and B{\"u}chner, Bernd and Cuniberti, Gianaurelio},
journal={Nanotechnology},
volume={24},
number={23},
pages={235708},
year={2013},
publisher={IOP Publishing}
}

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