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Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy
Reference
Imad Ibrahim, Mark H Rümmeli, Nitesh Ranjan, Bernd Büchner, Gianaurelio Cuniberti, "Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy", In Nanotechnology, IOP Publishing, vol. 24, no. 23, pp. 235708, 2013.
Bibtex
@article{ibrahim2013spatial,
title={Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy},
author={Ibrahim, Imad and R{\"u}mmeli, Mark H and Ranjan, Nitesh and B{\"u}chner, Bernd and Cuniberti, Gianaurelio},
journal={Nanotechnology},
volume={24},
number={23},
pages={235708},
year={2013},
publisher={IOP Publishing}
}
title={Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy},
author={Ibrahim, Imad and R{\"u}mmeli, Mark H and Ranjan, Nitesh and B{\"u}chner, Bernd and Cuniberti, Gianaurelio},
journal={Nanotechnology},
volume={24},
number={23},
pages={235708},
year={2013},
publisher={IOP Publishing}
}
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