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Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy
Reference
J. Murawski, T. Mönch, P. Milde, M. P. Hein, S. Nicht, U. Zerweck-Trogisch, L. M. Eng, "Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy", In Journal of Applied Physics, vol. 118, no. 24, pp. 244502, 2015. [doi]
Bibtex
@article{doi:10.1063/1.4938529,
author = {J. Murawski and T. Mönch and P. Milde and M. P. Hein and S. Nicht and U. Zerweck-Trogisch and L. M. Eng},
title = {Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy},
journal = {Journal of Applied Physics},
volume = {118},
number = {24},
pages = {244502},
year = {2015},
doi = {10.1063/1.4938529},
URL = {
http://dx.doi.org/10.1063/1.4938529
},
eprint = {
http://dx.doi.org/10.1063/1.4938529
}
}
author = {J. Murawski and T. Mönch and P. Milde and M. P. Hein and S. Nicht and U. Zerweck-Trogisch and L. M. Eng},
title = {Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy},
journal = {Journal of Applied Physics},
volume = {118},
number = {24},
pages = {244502},
year = {2015},
doi = {10.1063/1.4938529},
URL = {
http://dx.doi.org/10.1063/1.4938529
},
eprint = {
http://dx.doi.org/10.1063/1.4938529
}
}
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