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Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene

Reference

Nils Richter, Yenny R Hernandez, Sebastian Schweitzer, June-Seo Kim, Ajit Kumar Patra, Jan Englert, Ingo Lieberwirth, Andrea Liscio, Vincenzo Palermo, Xinliang Feng, Andreas Hirsch, Klaus Müllen, Mathias Kläui, "Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene" , In Physical Review Applied, APS, vol. 7, no. 2, pp. 024022, 2017.

Bibtex

@article{richter2017robust,
title={Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene},
author={Richter, Nils and Hernandez, Yenny R and Schweitzer, Sebastian and Kim, June-Seo and Patra, Ajit Kumar and Englert, Jan and Lieberwirth, Ingo and Liscio, Andrea and Palermo, Vincenzo and Feng, Xinliang and Hirsch, Andreas and Müllen, Klaus and Kläui, Mathias},
journal={Physical Review Applied},
volume={7},
number={2},
pages={024022},
year={2017},
publisher={APS}
}

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Related Paths

Organic / Polymer Path, Prof. Feng

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https://cfaed.tu-dresden.de/publications?pubId=1444


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