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Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene
Reference
Nils Richter, Yenny R Hernandez, Sebastian Schweitzer, June-Seo Kim, Ajit Kumar Patra, Jan Englert, Ingo Lieberwirth, Andrea Liscio, Vincenzo Palermo, Xinliang Feng, Andreas Hirsch, Klaus Müllen, Mathias Kläui, "Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene", In Physical Review Applied, APS, vol. 7, no. 2, pp. 024022, 2017.
Bibtex
@article{richter2017robust,
title={Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene},
author={Richter, Nils and Hernandez, Yenny R and Schweitzer, Sebastian and Kim, June-Seo and Patra, Ajit Kumar and Englert, Jan and Lieberwirth, Ingo and Liscio, Andrea and Palermo, Vincenzo and Feng, Xinliang and Hirsch, Andreas and Müllen, Klaus and Kläui, Mathias},
journal={Physical Review Applied},
volume={7},
number={2},
pages={024022},
year={2017},
publisher={APS}
}
title={Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene},
author={Richter, Nils and Hernandez, Yenny R and Schweitzer, Sebastian and Kim, June-Seo and Patra, Ajit Kumar and Englert, Jan and Lieberwirth, Ingo and Liscio, Andrea and Palermo, Vincenzo and Feng, Xinliang and Hirsch, Andreas and Müllen, Klaus and Kläui, Mathias},
journal={Physical Review Applied},
volume={7},
number={2},
pages={024022},
year={2017},
publisher={APS}
}
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Related Paths
Organic / Polymer Path, Prof. Feng
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