cfaed Publications

CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems

Reference

Siva Satyendra Sahoo, Bharadwaj Veeravalli, Akash Kumar, "CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems" , In Proceeding: 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID), vol. , no. , pp. 1-6, Jan 2018. [doi]

Bibtex

@INPROCEEDINGS{VLSID2018-siva,
author={Siva Satyendra Sahoo and Bharadwaj Veeravalli and Akash Kumar},
booktitle={2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID)},
title={CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems },
year={2018},
volume={},
number={},
pages={1-6},
keywords={Cross-layer Resilience, Real-time systems, FaultTolerance },
doi={},
ISSN={},
month={Jan},}

Downloads

VLSID-2018-siva [PDF]

Related Paths

Resilience Path

Permalink

https://cfaed.tu-dresden.de/publications?pubId=1655


Go back to publications list