cfaed Publications
CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems
Reference
Siva Satyendra Sahoo, Bharadwaj Veeravalli, Akash Kumar, "CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems", In Proceeding: 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID), pp. 1-6, Jan 2018.
Bibtex
@INPROCEEDINGS{VLSID2018-siva,
author={Siva Satyendra Sahoo and Bharadwaj Veeravalli and Akash Kumar},
booktitle={2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID)},
title={CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems },
year={2018},
volume={},
number={},
pages={1-6},
keywords={Cross-layer Resilience, Real-time systems, FaultTolerance },
doi={},
ISSN={},
month={Jan},}
author={Siva Satyendra Sahoo and Bharadwaj Veeravalli and Akash Kumar},
booktitle={2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID)},
title={CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems },
year={2018},
volume={},
number={},
pages={1-6},
keywords={Cross-layer Resilience, Real-time systems, FaultTolerance },
doi={},
ISSN={},
month={Jan},}
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VLSID-2018-siva [PDF]
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