cfaed Publications
Variability and Reliability Awareness in the Age of Dark Silicon
Reference
Florian Kriebel, Muhammad Shafique, Semeen Rehman, Jörg Henkel, Siddharth Garg, "Variability and Reliability Awareness in the Age of Dark Silicon", In IEEE Design & Test, IEEE, vol. 33, no. 2, pp. 59–67, 2016.
Bibtex
@article{kriebel2016variability,
title={Variability and Reliability Awareness in the Age of Dark Silicon},
author={Kriebel, Florian and Shafique, Muhammad and Rehman, Semeen and Henkel, J{\"o}rg and Garg, Siddharth},
journal={IEEE Design \& Test},
volume={33},
number={2},
pages={59--67},
year={2016},
publisher={IEEE}
}
title={Variability and Reliability Awareness in the Age of Dark Silicon},
author={Kriebel, Florian and Shafique, Muhammad and Rehman, Semeen and Henkel, J{\"o}rg and Garg, Siddharth},
journal={IEEE Design \& Test},
volume={33},
number={2},
pages={59--67},
year={2016},
publisher={IEEE}
}
Downloads
No Downloads available for this publication
Related Paths
Permalink
https://cfaed.tu-dresden.de/publications?pubId=1877