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Variability and Reliability Awareness in the Age of Dark Silicon

Reference

Florian Kriebel, Muhammad Shafique, Semeen Rehman, Jörg Henkel, Siddharth Garg, "Variability and Reliability Awareness in the Age of Dark Silicon" , In IEEE Design & Test, IEEE, vol. 33, no. 2, pp. 59–67, 2016.

Bibtex

@article{kriebel2016variability,
title={Variability and Reliability Awareness in the Age of Dark Silicon},
author={Kriebel, Florian and Shafique, Muhammad and Rehman, Semeen and Henkel, J{\"o}rg and Garg, Siddharth},
journal={IEEE Design \& Test},
volume={33},
number={2},
pages={59--67},
year={2016},
publisher={IEEE}
}

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