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Length separation of single-walled carbon nanotubes and its impact on structural and electrical properties of wafer-level fabricated carbon nanotube\textendashfield-effect transistors

Reference

Simon Böttger, Sascha Hermann, Stefan E Schulz, Thomas Gessner, "Length separation of single-walled carbon nanotubes and its impact on structural and electrical properties of wafer-level fabricated carbon nanotube\textendashfield-effect transistors", In Nanotechnology, IOP Publishing, vol. 27, no. 43, pp. 435203, Sep 2016. [doi]

Bibtex

@article{B_ttger_2016,
doi = {10.1088/0957-4484/27/43/435203},
url = {https://doi.org/10.1088%2F0957-4484%2F27%2F43%2F435203},
year = 2016,
month = {sep},
publisher = {{IOP} Publishing},
volume = {27},
number = {43},
pages = {435203},
author = {Simon Böttger and Sascha Hermann and Stefan E Schulz and Thomas Gessner},
title = {Length separation of single-walled carbon nanotubes and its impact on structural and electrical properties of wafer-level fabricated carbon nanotube{\textendash}field-effect transistors},
journal = {Nanotechnology}
}

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