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Projected Tolerances of Carbon Nanotube Current-Mode Logic to Process Variability

Reference

Muthupandian Cheralathan, Martin Claus, Stefan Blawid, "Projected Tolerances of Carbon Nanotube Current-Mode Logic to Process Variability" , In IEEE Transactions on Circuits and Systems II: Express Briefs, Institute of Electrical and Electronics Engineers (IEEE), vol. 65, no. 6, pp. 704–708, Jun 2018. [doi]

Bibtex

@article{Cheralathan_2018,
doi = {10.1109/tcsii.2017.2781139},
url = {https://doi.org/10.1109%2Ftcsii.2017.2781139},
year = 2018,
month = {jun},
publisher = {Institute of Electrical and Electronics Engineers ({IEEE})},
volume = {65},
number = {6},
pages = {704--708},
author = {Muthupandian Cheralathan and Martin Claus and Stefan Blawid},
title = {Projected Tolerances of Carbon Nanotube Current-Mode Logic to Process Variability},
journal = {{IEEE} Transactions on Circuits and Systems {II}: Express Briefs}
}

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