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Formation and crystallographic orientation of NiSi2\textendashSi interfaces

Reference

Florian Fuchs, Muhammad Bilal Khan, Dipjyoti Deb, Darius Pohl, Jörg Schuster, Walter M. Weber, Uwe Mühle, Markus Löffler, Yordan M. Georgiev, Artur Erbe, Sibylle Gemming, "Formation and crystallographic orientation of NiSi2\textendashSi interfaces" , In Journal of Applied Physics, AIP Publishing, vol. 128, no. 8, pp. 085301, Aug 2020. [doi]

Bibtex

@article{Fuchs_2020,
doi = {10.1063/1.5143122},
url = {https://doi.org/10.1063%2F1.5143122},
year = 2020,
month = {aug},
publisher = {{AIP} Publishing},
volume = {128},
number = {8},
pages = {085301},
author = {Florian Fuchs and Muhammad Bilal Khan and Dipjyoti Deb and Darius Pohl and Jörg Schuster and Walter M. Weber and Uwe Mühle and Markus Löffler and Yordan M. Georgiev and Artur Erbe and Sibylle Gemming},
title = {Formation and crystallographic orientation of {NiSi}2{\textendash}Si interfaces},
journal = {Journal of Applied Physics}
}

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