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Full-field X-ray microscopy with crossed partial multilayer Laue lenses

Reference

Sven Niese, Peter Krüger, Adam Kubec, Stefan Braun, Jens Patommel, Christian G Schroer, Andreas Leson, Ehrenfried Zschech, "Full-field X-ray microscopy with crossed partial multilayer Laue lenses" , In Optics express, Optical Society of America, vol. 22, no. 17, pp. 20008–20013, 2014. [doi]

Bibtex

@article{niese2014full,
title={Full-field X-ray microscopy with crossed partial multilayer Laue lenses},
author={Niese, Sven and Kr{\"u}ger, Peter and Kubec, Adam and Braun, Stefan and Patommel, Jens and Schroer, Christian G and Leson, Andreas and Zschech, Ehrenfried},
journal={Optics express},
volume={22},
number={17},
pages={20008--20013},
year={2014},
publisher={Optical Society of America},
doi={10.1364/OE.22.020008}
}

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