cfaed Publications
Solution Shearing of Sustainable Aluminum Oxide Thin Films for Compliance‐Free, Voltage‐Regulated Multi‐Bit Memristors
Reference
Preetam Dacha, Anju Kumari R, Darius Pohl, Angelika Wrzesińska‐Lashkova, Alexander Tahn, Bernd Rellinghaus, Yana Vaynzof, Stefan C. B. Mannsfeld, "Solution Shearing of Sustainable Aluminum Oxide Thin Films for Compliance‐Free, Voltage‐Regulated Multi‐Bit Memristors", In Advanced Electronic Materials, Wiley, Jan 2025. [doi]
Bibtex
@article{Dacha_2025, title={Solution Shearing of Sustainable Aluminum Oxide Thin Films for Compliance‐Free, Voltage‐Regulated Multi‐Bit Memristors}, ISSN={2199-160X}, url={http://dx.doi.org/10.1002/aelm.202400698}, DOI={10.1002/aelm.202400698}, journal={Advanced Electronic Materials}, publisher={Wiley}, author={Dacha, Preetam and Kumari R, Anju and Pohl, Darius and Wrzesińska‐Lashkova, Angelika and Tahn, Alexander and Rellinghaus, Bernd and Vaynzof, Yana and Mannsfeld, Stefan C. B.}, year={2025}, month=jan }
Downloads
No Downloads available for this publication
Permalink
https://cfaed.tu-dresden.de/publications?pubId=3807