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Preparation and characterization of silicon nanowires using SEM/FIB and TEM: Paper presented at “XV International Conference on Electron Microscopy”, 15–18 September 2014, Cracow, Poland

Reference

Sayanti Banerjee, Uwe Muehle, Markus Löffler, Andre Heinzig, Jens Trommer, Ehrenfried Zschech, "Preparation and characterization of silicon nanowires using SEM/FIB and TEM: Paper presented at “XV International Conference on Electron Microscopy”, 15–18 September 2014, Cracow, Poland" , In International Journal of Materials Research, Carl Hanser Verlag, vol. 106, no. 7, pp. 697–702, 2015.

Bibtex

@article{banerjee2015preparation,
title={Preparation and characterization of silicon nanowires using SEM/FIB and TEM: Paper presented at “XV International Conference on Electron Microscopy”, 15--18 September 2014, Cracow, Poland},
author={Banerjee, Sayanti and Muehle, Uwe and L{\"o}ffler, Markus and Heinzig, Andre and Trommer, Jens and Zschech, Ehrenfried},
journal={International Journal of Materials Research},
volume={106},
number={7},
pages={697--702},
year={2015},
publisher={Carl Hanser Verlag}
}

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Related Paths

DCN, Silicon Nanowire Path, Silicon Nanowire Path, DCN, Silicon Nanowire Path, DCN

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