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Design, modelling and characterization of transmission lines for mm-wave silicon ICs

Reference

Jan Dirk Leufker, David Fritsche, Gregor Tretter, Mahdi Khafaji, Corrado Carta, Frank Ellinger, "Design, modelling and characterization of transmission lines for mm-wave silicon ICs", In Proceeding: 2015 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC), IEEE, pp. 1–4, Nov 2015. [doi]

Abstract

This paper describes the design, modelling and characterization of transmission lines for millimetre wave silicon integrated circuits up to 65 GHz. The simulation results of three different EM simulators for a selected hybrid coplanar layout structure are presented. Two different deembedding methods are investigated and compared with respect to sensitivity to typical measurement errors. Finally both methods are applied to the measurement results of the fabricated test structures in a 250 nm BiCMOS technology showing good agreement to EM simulations and predicted sensitivity to measurement errors.

Bibtex

@inproceedings{Leufker2015,
abstract = {This paper describes the design, modelling and characterization of transmission lines for millimetre wave silicon integrated circuits up to 65 GHz. The simulation results of three different EM simulators for a selected hybrid coplanar layout structure are presented. Two different deembedding methods are investigated and compared with respect to sensitivity to typical measurement errors. Finally both methods are applied to the measurement results of the fabricated test structures in a 250 nm BiCMOS technology showing good agreement to EM simulations and predicted sensitivity to measurement errors.},
author = {Leufker, Jan Dirk and Fritsche, David and Tretter, Gregor and Khafaji, Mahdi and Carta, Corrado and Ellinger, Frank},
booktitle = {2015 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC)},
doi = {10.1109/IMOC.2015.7369151},
isbn = {978-1-4673-9492-5},
keywords = {CoolWA,EM simulation,HAEC-01,HAEC-A01,Impedance,Integrated circuit modeling,Layout,Leu15b,Measurement errors,Metals,Simulation,Transmission line measurements,cfAED-Res,coplanar waveguide,deembedding,microstrip,millimetre wave integrated circuits,transmission line},
mendeley-groups = {CC-Own/Proceedings},
mendeley-tags = {CoolWA,HAEC-01,HAEC-A01,Leu15b,cfAED-Res},
month = {nov},
pages = {1--4},
publisher = {IEEE},
shorttitle = {Microwave and Optoelectronics Conference (IMOC), 2},
title = ,
url = {http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=7369151},
year = {2015}
}

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