Shubham Rai

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E-mail

Phone

Fax

Visitor's Address

shubham.rai@tu-dresden.de

+49 351 463-43727

+49 (0)351 463-39995

Helmholtzstrasse 18, BAR-III76

Publications

  • 2020

  • 7. S. Rai, M. Raitza, S. S. Sahoo, A. Kumar, "DISCERN: DISTILLING STANDARD CELLS FOR EMERGING RECONFIGURABLE NANOTECHNOLOGIES" (to appear), In Proceeding: 2020 Design, Automation Test in Europe Conference Exhibition (DATE), March 2020. [Bibtex & Downloads]
  • 2019

  • 6. A. Rupani, S. Rai, A. Kumar, "Exploiting Emerging Reconfigurable Technologies for Secure Devices" , In Proceeding: Euromicro DSD, August 2019. [Bibtex & Downloads]
  • 5. S. Rai, A. Rupani, P. Nath, A. Kumar, "Hardware Watermarking Using Polymorphic Inverter Designs Based On Reconfigurable Nanotechnologies" , In Proceeding: ISVLSI, July 2019. [Bibtex & Downloads]
  • 4. S. Rai, J. Trommer, M. Raitza, T. Mikolajick, W. M. Weber, A. Kumar, "Designing Efficient Circuits Based on Runtime-Reconfigurable Field-Effect Transistors" , In IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 27, no. 3, pp. 560-572, March 2019. [doi] [Bibtex & Downloads]
  • 2018

  • 3. Shubham Rai, Srivatsa Srinivasa, Patsy Cadareanu, Xunzhao Yin, Xiaobo Sharon Hu, Pierre-Emmanuel Gaillardon, Vijaykrishnan Narayanan, Akash Kumar, "Emerging Reconfigurable Nanotechnologies: Can They Support Future Electronics?" , Proceedings of the International Conference on Computer-Aided Design, ACM, pp. 13:1–13:8, New York, NY, USA, November 2018. [doi] [Bibtex & Downloads]
  • 2. S. Rai, M. Raitza, A. Kumar, "Technology mapping flow for emerging reconfigurable silicon nanowire transistors" , In Proceeding: 2018 Design, Automation Test in Europe Conference Exhibition (DATE), vol. , no. , pp. 767-772, March 2018. [doi] [Bibtex & Downloads]
  • 1. S. Rai, A. Rupani, D. Walter, M. Raitza, A. Heinzig, T. Baldauf, J. Trommer, C. Mayr, W. M. Weber, A. Kumar, "A physical synthesis flow for early technology evaluation of silicon nanowire based reconfigurable FETs" , In Proceeding: 2018 Design, Automation Test in Europe Conference Exhibition (DATE), vol. , no. , pp. 605-608, March 2018. [doi] [Bibtex & Downloads]